Long term experimental verification of a single chip quantum random number generator fabricated on the InP platform
School of Physics, Aristotle University of Thessaloniki, 54124, Thessaloniki, Greece
2 atlanTTic Research Center, University of Vigo, El Telecommunication, Campus Universitario s/n, 36310, Vigo, Spain
3 School of Electronic Engineering, Dublin City University, Glasnevin, Dublin 9, Ireland
4 Keysight Technologies, Santa Clara, CA, USA
5 Dpto. Teoría de la Señal y Comunicaciones e Ingeniería Telemática, University of Valladolid, Campus Miguel Delibes, Paseo Belén n°15, 47011, Valladolid, Spain
Accepted: 7 February 2023
Published online: 10 February 2023
This work presents the results from the experimental evaluation of a quantum random number generator circuit over a period of 300 minutes based on a single chip fabricated on the InP platform. The circuit layout contains a gain switched laser diode (LD), followed by a balanced Mach Zehnder Interferometer for proper light power distribution to the two arms of an unbalanced MZI incorporating a 65.4 mm long spiral waveguide that translates the random phase fluctuations to power variations. The LD was gain-switched at 1.3 GHz and the chip delivered a min-entropy of 0.5875 per bit after removal of the classical noise, resulting a total aggregate bit rate of 6.11 Gbps. The recoded data set successfully passed the 15-battery test NIST statistical test suite for all data sets.
Key words: Quantum random number generator / InP platform / Integrated optics / Integrated quantum devices
© The Author(s) 2023
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